CINECA IRIS Institutional Research Information System

Sfoglia per Autore  

Opzioni
Mostra risultati da 1 a 20 di 107
Titolo Data di pubblicazione Autore(i) File
Ga(1-x) Al(x) As band structure from I-V, C-V measurements on Schottky diodes 1-gen-1980 Diligenti, Alessandro; B., Pellegrini; G., Salardi; Bagnoli, PAOLO EMILIO; G., Flores
Experimental determination of intervalley energy gaps as a temperature function for Ga(1-x)Al(x)As 1-gen-1980 Bagnoli, PAOLO EMILIO; Diligenti, Alessandro; G., Salardi
Sensori a stato solido per misure di concentrazione di idrogeno e deuterio 1-gen-1984 Bagnoli, PAOLO EMILIO; V., Ciuti; Diligenti, Alessandro; Nannini, Andrea; M., Schiaffino
TRANSIENT-BEHAVIOR OF FLAT-BAND VOLTAGE DURING HYDROGEN AND DEUTERIUM ADSORPTION ON PD-GATE MOS STRUCTURES 1-gen-1985 Nannini, Andrea; Bagnoli, PAOLO EMILIO; Diligenti, Alessandro; Ciuti, Virgilio
Electromigration detection by means of low-frequency noise measurements in thin films interconnections 1-gen-1985 Diligenti, Alessandro; Neri, Bruno; Bagnoli, PAOLO EMILIO; A., Barsanti; M., Rizzo
Testing the electron devices reliability by means of noise measurements 1-gen-1986 Bagnoli, PAOLO EMILIO; Diligenti, Alessandro; L., Lagana'; Neri, Bruno
Evaluation of Electromigration activation energy by means of noise measurements and MTF tests 1-gen-1987 Diligenti, Alessandro; Bagnoli, PAOLO EMILIO; Neri, Bruno; G., Specchiulli
Damage in thin film aluminum interconnections and 1/f noise spectra measured during electromigration 1-gen-1987 Bagnoli, PAOLO EMILIO; S., Ciucci; Diligenti, Alessandro; Neri, Bruno
EFFECTS OF INTERFACIAL STATES ON THE CAPACITANCE-VOLTAGE CHARACTERISTICS OF PD/SIO2/N-SI SCHOTTKY DIODES 1-gen-1987 Bagnoli, PAOLO EMILIO; Nannini, Andrea
Electromigration and low-frequency resistance fluctuations in aluminum thin film interconnections 1-gen-1987 Neri, Bruno; Diligenti, Alessandro; Bagnoli, PAOLO EMILIO
Conductivity variations induced by water vapour adsorption in granular metal films 1-gen-1987 Nannini, Andrea; Bagnoli, PAOLO EMILIO; Diligenti, Alessandro; Neri, Bruno; S., Pugliese
Noise in thin metal films during electromigration: a method to determine activation energy of grain boundary vacancies 1-gen-1987 Bagnoli, PAOLO EMILIO; Diligenti, Alessandro; Neri, Bruno
Noise measurements in thin film interconnections : a non destructive technique to characterize electromigration 1-gen-1988 Bagnoli, PAOLO EMILIO; Diligenti, Alessandro; Neri, Bruno; S., Ciucci
Humidity sensing with granular metal thin films 1-gen-1988 Bagnoli, PAOLO EMILIO; Nannini, Andrea
Characterization and diagnostics of VLSI microstructures 1-gen-1989 Bagnoli, PAOLO EMILIO; Basso, Giovanni; Ciofi, Carmine; Diligenti, Alessandro; Macucci, Massimo; M., Mule'; Neri, Bruno; B., Pellegrini; Saletti, Roberto
Transient behavior of UV-induced interface states in Au-SiO2-n Si tunnel diodes 1-gen-1989 Bagnoli, PAOLO EMILIO
On the capacitance of metal/thin oxide/semiconductor structures with localized oxide states 1-gen-1989 Nannini, Andrea; Bagnoli, PAOLO EMILIO
A study of electromigrations in aluminum and aluminum-silicon thin film resistors using noise technique 1-gen-1989 Diligenti, Alessandro; Bagnoli, PAOLO EMILIO; Neri, Bruno; S., Bea; L., Mantellassi
Surface Characteristics of Plasma Treated WNx/GaAs Contacts from C-V Measurements 1-gen-1990 Bagnoli, PAOLO EMILIO; A., Paccagnella; A., Callegari; F., Fantini
Analysis of High Barrier WN/GaAs Contacts 1-gen-1990 Bagnoli, PAOLO EMILIO; A., Paccagnella; A., Callegari; F., Fantini
Mostra risultati da 1 a 20 di 107
Legenda icone

  •  file ad accesso aperto
  •  file disponibili sulla rete interna
  •  file disponibili agli utenti autorizzati
  •  file disponibili solo agli amministratori
  •  file sotto embargo
  •  nessun file disponibile