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Titolo Data di pubblicazione Autore(i) File
EQUIVALENT-CIRCUIT AND STATISTICS OF BURST NOISE IN BIPOLAR-TRANSISTORS 1-gen-1983 Noci, Ge; Neri, Bruno; Terreni, Pierangelo
Electromigration detection by means of low-frequency noise measurements in thin films interconnections 1-gen-1985 Diligenti, Alessandro; Neri, Bruno; Bagnoli, PAOLO EMILIO; A., Barsanti; M., Rizzo
MINIMUM NUMBER OF LORENTZIAN SPECTRA SUFFICIENT TO YIELD 1/F-GAMMA SPECTRUM 1-gen-1986 Pellegrini, Bruno; Neri, Bruno; Saletti, Roberto
Testing the electron devices reliability by means of noise measurements 1-gen-1986 Bagnoli, PAOLO EMILIO; Diligenti, Alessandro; L., Lagana'; Neri, Bruno
Minimization of low frequency noise sources in electronic measurements 1-gen-1986 Pellegrini, Bruno; Saletti, Roberto; Neri, Bruno; P., Terreni
Conductivity variations induced by water vapour adsorption in granular metal films 1-gen-1987 Nannini, Andrea; Bagnoli, PAOLO EMILIO; Diligenti, Alessandro; Neri, Bruno; S., Pugliese
Evaluation of Electromigration activation energy by means of noise measurements and MTF tests 1-gen-1987 Diligenti, Alessandro; Bagnoli, PAOLO EMILIO; Neri, Bruno; G., Specchiulli
Low-frequency noise in silicon-gate metal-oxide-silicon capacitors before oxide breakdown 1-gen-1987 Neri, Bruno; Olivo, P.; Ricco'B,
Electromigration and low-frequency resistance fluctuations in aluminum thin film interconnections 1-gen-1987 Neri, Bruno; Diligenti, Alessandro; Bagnoli, PAOLO EMILIO
Damage in thin film aluminum interconnections and 1/f noise spectra measured during electromigration 1-gen-1987 Bagnoli, PAOLO EMILIO; S., Ciucci; Diligenti, Alessandro; Neri, Bruno
Noise in thin metal films during electromigration: a method to determine activation energy of grain boundary vacancies 1-gen-1987 Bagnoli, PAOLO EMILIO; Diligenti, Alessandro; Neri, Bruno
Noise measurements in thin film interconnections : a non destructive technique to characterize electromigration 1-gen-1988 Bagnoli, PAOLO EMILIO; Diligenti, Alessandro; Neri, Bruno; S., Ciucci
A study of electromigrations in aluminum and aluminum-silicon thin film resistors using noise technique 1-gen-1989 Diligenti, Alessandro; Bagnoli, PAOLO EMILIO; Neri, Bruno; S., Bea; L., Mantellassi
Characterization and diagnostics of VLSI microstructures 1-gen-1989 Bagnoli, PAOLO EMILIO; Basso, Giovanni; Ciofi, Carmine; Diligenti, Alessandro; Macucci, Massimo; M., Mule'; Neri, Bruno; B., Pellegrini; Saletti, Roberto
CORRELATED FLUCTUATIONS AND NOISE SPECTRA OF TUNNELING AND SUBSTRATE CURRENTS BEFORE BREAKDOWN IN THIN-OXIDE MOS DEVICES 1-gen-1990 Saletti, Roberto; Neri, Bruno; Olivo, P; Modelli, A.
VARIATIONS OF TEMPERATURE-COEFFICIENT AND NOISE IN THIN AL AND AL-SI RESISTORS SUBJECTED TO HIGH-CURRENT DENSITY 1-gen-1991 Diligenti, Alessandro; Neri, Bruno; Nannini, Andrea; Ciucci, S.
ULTRA LOW-NOISE PREAMPLIFIER FOR LOW-FREQUENCY NOISE MEASUREMENTS IN ELECTRON DEVICES 1-gen-1991 Neri, Bruno; Pellegrini, Bruno; Saletti, Roberto
LOW-FREQUENCY NOISE MEASUREMENTS AS A COMPLEMENTARY TOOL IN THE INVESTIGATION OF INTEGRATED-CIRCUIT RELIABILITY 1-gen-1992 Diligenti, Alessandro; Neri, Bruno; Saletti, Roberto
LOW-NOISE AUTOMATED MEASUREMENT SYSTEM FOR LOW-FREQUENCY CURRENT FLUCTUATIONS IN THIN-OXIDE SILICON STRUCTURES 1-gen-1992 Saletti, Roberto; Neri, Bruno
LOW-FREQUENCY ELECTROMIGRATION NOISE AND FILM MICROSTRUCTURE IN AL/SI STRIPES - ELECTRICAL MEASUREMENTS AND TEM ANALYSIS 1-gen-1993 Ciofi, Carmine; Diligenti, Alessandro; Giacomozzi, F; Nannini, Andrea; Neri, Bruno
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