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Ga(1-x) Al(x) As band structure from I-V, C-V measurements on Schottky diodes 1-gen-1980 Diligenti, Alessandro; B., Pellegrini; G., Salardi; Bagnoli, PAOLO EMILIO; G., Flores
Experimental determination of intervalley energy gaps as a temperature function for Ga(1-x)Al(x)As 1-gen-1980 Bagnoli, PAOLO EMILIO; Diligenti, Alessandro; G., Salardi
Sensori a stato solido per misure di concentrazione di idrogeno e deuterio 1-gen-1984 Bagnoli, PAOLO EMILIO; V., Ciuti; Diligenti, Alessandro; Nannini, Andrea; M., Schiaffino
Electromigration detection by means of low-frequency noise measurements in thin films interconnections 1-gen-1985 Diligenti, Alessandro; Neri, Bruno; Bagnoli, PAOLO EMILIO; A., Barsanti; M., Rizzo
TRANSIENT-BEHAVIOR OF FLAT-BAND VOLTAGE DURING HYDROGEN AND DEUTERIUM ADSORPTION ON PD-GATE MOS STRUCTURES 1-gen-1985 Nannini, Andrea; Bagnoli, PAOLO EMILIO; Diligenti, Alessandro; Ciuti, Virgilio
Testing the electron devices reliability by means of noise measurements 1-gen-1986 Bagnoli, PAOLO EMILIO; Diligenti, Alessandro; L., Lagana'; Neri, Bruno
Evaluation of Electromigration activation energy by means of noise measurements and MTF tests 1-gen-1987 Diligenti, Alessandro; Bagnoli, PAOLO EMILIO; Neri, Bruno; G., Specchiulli
Electromigration and low-frequency resistance fluctuations in aluminum thin film interconnections 1-gen-1987 Neri, Bruno; Diligenti, Alessandro; Bagnoli, PAOLO EMILIO
Damage in thin film aluminum interconnections and 1/f noise spectra measured during electromigration 1-gen-1987 Bagnoli, PAOLO EMILIO; S., Ciucci; Diligenti, Alessandro; Neri, Bruno
Conductivity variations induced by water vapour adsorption in granular metal films 1-gen-1987 Nannini, Andrea; Bagnoli, PAOLO EMILIO; Diligenti, Alessandro; Neri, Bruno; S., Pugliese
Noise in thin metal films during electromigration: a method to determine activation energy of grain boundary vacancies 1-gen-1987 Bagnoli, PAOLO EMILIO; Diligenti, Alessandro; Neri, Bruno
Noise measurements in thin film interconnections : a non destructive technique to characterize electromigration 1-gen-1988 Bagnoli, PAOLO EMILIO; Diligenti, Alessandro; Neri, Bruno; S., Ciucci
Characterization and diagnostics of VLSI microstructures 1-gen-1989 Bagnoli, PAOLO EMILIO; Basso, Giovanni; Ciofi, Carmine; Diligenti, Alessandro; Macucci, Massimo; M., Mule'; Neri, Bruno; B., Pellegrini; Saletti, Roberto
A study of electromigrations in aluminum and aluminum-silicon thin film resistors using noise technique 1-gen-1989 Diligenti, Alessandro; Bagnoli, PAOLO EMILIO; Neri, Bruno; S., Bea; L., Mantellassi
VARIATIONS OF TEMPERATURE-COEFFICIENT AND NOISE IN THIN AL AND AL-SI RESISTORS SUBJECTED TO HIGH-CURRENT DENSITY 1-gen-1991 Diligenti, Alessandro; Neri, Bruno; Nannini, Andrea; Ciucci, S.
LOW-FREQUENCY NOISE MEASUREMENTS AS A COMPLEMENTARY TOOL IN THE INVESTIGATION OF INTEGRATED-CIRCUIT RELIABILITY 1-gen-1992 Diligenti, Alessandro; Neri, Bruno; Saletti, Roberto
DEPENDENCE OF ELECTROMIGRATION NOISE ON GEOMETRICAL AND STRUCTURAL CHARACTERISTICS IN ALUMINUM-BASED RESISTORS 1-gen-1994 Chicca, S; Ciofi, Carmine; Diligenti, Alessandro; Nannini, Andrea; Neri, Bruno
Characterization of YSZ Films by means of C-V Measurements and TEM Observations 1-gen-1995 Bagnoli, PAOLO EMILIO; Ciofi, Carmine; Diligenti, Alessandro; A., Innamorato; Nannini, Andrea
IMPROVED OPTICAL-EMISSION OF POROUS SILICON WITH DIFFERENT POSTANODIZATION PROCESSES 1-gen-1995 Pellegrini, V; Fuso, Francesco; Lorenzi, G; Allegrini, Maria; Diligenti, Alessandro; Nannini, Andrea; Pennelli, Giovanni
Electrical characterization of metal Schottky contacts on luminescent porous silicon 1-gen-1996 Diligenti, Alessandro; Nannini, Andrea; Pennelli, Giovanni; Pellegrini, Vittorio; Fuso, Francesco; Allegrini, Maria
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