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Titolo Data di pubblicazione Autore(i) File
Variance and centroid optimisation in x-ray diffraction analysis 1-gen-1993 Berti, Giovanni
Microcrystalline properties of quartz by means of XRPD measurements 1-gen-1994 Berti, Giovanni
DISVA93:A Software Package for Determinining Systematic Effects in X-ray Powder Diffractometry 1-gen-1995 Berti, Giovanni; Giubbilini, S.; Tognoni, E.
Detection and Modelling of Micro-crystallinity by means of X-Ray Powder Diffractometry 1-gen-1995 Berti, Giovanni
Microstructure of Magnetite from XRPD data in relation to Magnetism 1-gen-1996 Berti, Giovanni; Pinna, E.
European Standardisation of XRPD Measurements 1-gen-1996 Berti, Giovanni
Introduction to the second Round table on Aims and Progresses of European XRPD Standardisation 1-gen-1996 Berti, Giovanni
DISVAR96: a new software version for the diffraction instrumental monotoring 1-gen-1996 Berti, Giovanni; Alessandro, Enea
Crystalline microstructure of natural samples from peak profile analysis of polycrystalline diffraction data 1-gen-1996 Berti, Giovanni
Repeatability and reproducibility of XRPD measurements 1-gen-1997 Berti, Giovanni; Aquilina, G.; Cappuccio, G.; Fares, V.; Tognoni, E.; Veroli, C.
The impact of XRPD standardisation on European industry, research and related social activity 1-gen-1997 Berti, Giovanni
Modelling and Optimization Algorithm to Analyse XRPD Data via Modulation and pseudo-Voigt Functions 1-gen-1997 Berti, Giovanni
Modelling and optimisation algorithm to analyse XRPD data via modulation function and pseudo-voigt functions 1-gen-1997 Berti, Giovanni
Repeatability and reproducibility of XRPD measurements via Diffraction Instrumental Monotoring: results of the Italian Round Robin on KCl 1-gen-1998 Berti, Giovanni; Colombi, A.
Accuracy of XRPD measurements via Diffraction Instrumental Monitoring 1-gen-1999 Berti, Giovanni
Ambiguities of micro and nano-structural determination 1-gen-1999 Berti, Giovanni
Microstructure of polycrystalline natural samples from the peak profile analysis of diffraction data 1-gen-2000 Berti, Giovanni
A method for routine comparison of XRPD measurements 1-gen-2001 Berti, Giovanni
Standard tecnici per la diffrazione a raggi X 1-gen-2001 Berti, Giovanni; Vaccari, M.; Tolle, E.; D'Acunto, M.; DE MARCO, F.
Introduzione alla Diffrattometria XRPD e alla calibrazione dei Diffrattometri 1-gen-2001 Berti, Giovanni
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