The depletion depth of irradiated n-type silicon microstrip detectors can be inferred from both the reciprocal capacitance and from the amount of collected charge. Capacitance voltage (C-V) measurements at different frequencies and temperatures are being compared with the bias voltage dependence of the charge collection on an irradiated n-type magnetic Czochralski silicon detector. Good agreement between the reciprocal capacitance and the median collected charge is found when the frequency of the C-V measurement is selected such that it scales with the temperature dependence of the leakage current. Measuring C-V characteristics at prescribed combinations of temperature and frequency allows then a realistic estimate of the depletion characteristics of irradiated silicon strip detectors based on C-V data alone. (c) 2007 Published by Elsevier B.V.

Charge collection and capacitance-voltage analysis in irradiated n-type magnetic Czochralski silicon detectors

MESSINEO, ALBERTO MARIA;
2007-01-01

Abstract

The depletion depth of irradiated n-type silicon microstrip detectors can be inferred from both the reciprocal capacitance and from the amount of collected charge. Capacitance voltage (C-V) measurements at different frequencies and temperatures are being compared with the bias voltage dependence of the charge collection on an irradiated n-type magnetic Czochralski silicon detector. Good agreement between the reciprocal capacitance and the median collected charge is found when the frequency of the C-V measurement is selected such that it scales with the temperature dependence of the leakage current. Measuring C-V characteristics at prescribed combinations of temperature and frequency allows then a realistic estimate of the depletion characteristics of irradiated silicon strip detectors based on C-V data alone. (c) 2007 Published by Elsevier B.V.
2007
Petterson, M. K.; Sadrozinski, H. F. W.; Betancourt, C.; Bruzzi, M.; Scaringella, M.; Tosi, C.; Macchiolo, A.; Manna, N.; Creanza, D.; Boscardin, M.; Piemonte, C.; Zorzi, N.; Borrello, L.; Messineo, ALBERTO MARIA; Betta G. F., Dalla
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11568/116628
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