Durum wheat (Triticum durum Desf.) is commonly grown in dryland conditions, where environmental stress during grain filling can limit productivity and increase the dependency on stored assimilate. We investigated current assimilation and remobilization of dry matter and nitrogen during grain filling in N fertilized and unfertilized durum wheat subjected to different levels of water deficit during grain filling. Two durum wheat varieties, Appio and Creso, were grown in open-air containers with three rates of nitrogen fertilizer (not applied, NO; normal amount, NN; high amount, NH) and four water regimes during grain filling (fully irrigated treatment, FI; low, LWS, moderate, MWS and high water stress, HWS) across 2 years. Grain yield and dry matter and N accumulation and remobilization were positively affected by N availability and negatively by water stress during grain filling. The reduction of grain yield by severe post-anthesis water stress amounted to 27 and 37% for NO and NN, respectively, and was associated with a decrease in kernel weight. There was also a small negative effect on the number of kernels per spike. Conversely, the duration of grain filling was not modified either by water stress or by nitrogen treatments. Severe water stress also reduced dry matter accumulation and remobilization by 36 and 14% in NO plants and by 48 and 25% in NH plants. Similarly, N accumulation and N remobilization was reduced by 43% and by 16% in NO plants and by 51% and by 15% in NH plants. Conversely, low and moderate water stress did not substantially modify the patterns of dry matter and nitrogen deposition in grain. Although remobilization of dry matter and N was less affected by water stress than accumulation, it was not able to counterbalance the reduction of assimilation and consequently it was not able to stabilize grain yield under drought. (c) 2007 Elsevier B.V All rights reserved.

Post-anthesis dry matter and nitrogen dynamics in durum wheat as affected by nitrogen supply and soil water availability

MARIOTTI, MARCO;MASONI, ALESSANDRO;ARDUINI, IDUNA
Ultimo
2008-01-01

Abstract

Durum wheat (Triticum durum Desf.) is commonly grown in dryland conditions, where environmental stress during grain filling can limit productivity and increase the dependency on stored assimilate. We investigated current assimilation and remobilization of dry matter and nitrogen during grain filling in N fertilized and unfertilized durum wheat subjected to different levels of water deficit during grain filling. Two durum wheat varieties, Appio and Creso, were grown in open-air containers with three rates of nitrogen fertilizer (not applied, NO; normal amount, NN; high amount, NH) and four water regimes during grain filling (fully irrigated treatment, FI; low, LWS, moderate, MWS and high water stress, HWS) across 2 years. Grain yield and dry matter and N accumulation and remobilization were positively affected by N availability and negatively by water stress during grain filling. The reduction of grain yield by severe post-anthesis water stress amounted to 27 and 37% for NO and NN, respectively, and was associated with a decrease in kernel weight. There was also a small negative effect on the number of kernels per spike. Conversely, the duration of grain filling was not modified either by water stress or by nitrogen treatments. Severe water stress also reduced dry matter accumulation and remobilization by 36 and 14% in NO plants and by 48 and 25% in NH plants. Similarly, N accumulation and N remobilization was reduced by 43% and by 16% in NO plants and by 51% and by 15% in NH plants. Conversely, low and moderate water stress did not substantially modify the patterns of dry matter and nitrogen deposition in grain. Although remobilization of dry matter and N was less affected by water stress than accumulation, it was not able to counterbalance the reduction of assimilation and consequently it was not able to stabilize grain yield under drought. (c) 2007 Elsevier B.V All rights reserved.
2008
Ercoli, L; Lulli, L; Mariotti, Marco; Masoni, Alessandro; Arduini, Iduna
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11568/183748
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