Accurate Simulation of SEUs in the Configuration Memory of SRAM-based FPGAs

SRAM-based FPGAs are more and more relevant in a growing number of applications, ranging from the automotive to the aerospace ones. Designers of safety-critical applications demand accurate methodologies to evaluate the Single Event Upsets (SEUs) sensitivity of their designs. In this paper, we present an accurate simulation method for the evaluation of the effects of SEUs in the configuration memory of SRAM-based FPGAs. The approach is able to simulate SEUs affecting the configuration memory of both logic and routing resources since it is able to accurately model the electrical behavior of SEUs in the configuration memory. Detailed experimental results on a large set of benchmark circuits are provided and the comparison with fault injection experiments is shown in order to validate the accuracy of the proposed method. The results clearly demonstrate the benefits of our approach since simulation results predict almost completely the results obtained through fault injection.