SRAM-FPGA systems are simulated with a model based on the Stochastic Activity Networks (SAN) formalism. Faults are injected into the model and their propagation is traced to the output pins using a four-valued logic that enables faulty logical signals to be tagged and recognized without recurring to a comparison with the expected output values. Input vectors are generated probabilistically based on assumed signal probabilities. By this procedure it is possible to obtain a statistical assessment of the observability of different faults for the generated inputs. The analysis of a 2-out-of-2 voter is shown as a case study.
Simulated Injection of Radiation-Induced Logic Faults in FPGAs
BERNARDESCHI, CINZIA;CASSANO, LUCA MARIA;DOMENICI, ANDREA;
2011-01-01
Abstract
SRAM-FPGA systems are simulated with a model based on the Stochastic Activity Networks (SAN) formalism. Faults are injected into the model and their propagation is traced to the output pins using a four-valued logic that enables faulty logical signals to be tagged and recognized without recurring to a comparison with the expected output values. Input vectors are generated probabilistically based on assumed signal probabilities. By this procedure it is possible to obtain a statistical assessment of the observability of different faults for the generated inputs. The analysis of a 2-out-of-2 voter is shown as a case study.File in questo prodotto:
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