A scanning friction force microscope has been used to study the surfaces of lead zirconate titanate thin films prepared by sol-gel and pulsed laser ablation. As well as mapping the topography of the films the friction force has proven to be a sensitive tool which can be used to detect compositional changes. Although the laser deposited films had some larger defects up to 500 nm, the grains had a smooth texture (roughness approximate to 2-5 nm). Sol-gel films had grain sizes of the order of 150 nm and roughness of 20-50 nm. Zirconium rich films also had ''rosettes'' approximately 1 mu m in diameter and raised 200 nm above the surrounding matrix. The technique was sensitive enough to discern chemical differences at the grain boundaries and between the ''rosettes'' and the matrix.

Scanning and Friction Force Microscopy (SFFM) of Ferroelectric Pb(Zr,Ti)O3 Thin Films

ALLEGRINI, MARIA;FUSO, FRANCESCO;
1995-01-01

Abstract

A scanning friction force microscope has been used to study the surfaces of lead zirconate titanate thin films prepared by sol-gel and pulsed laser ablation. As well as mapping the topography of the films the friction force has proven to be a sensitive tool which can be used to detect compositional changes. Although the laser deposited films had some larger defects up to 500 nm, the grains had a smooth texture (roughness approximate to 2-5 nm). Sol-gel films had grain sizes of the order of 150 nm and roughness of 20-50 nm. Zirconium rich films also had ''rosettes'' approximately 1 mu m in diameter and raised 200 nm above the surrounding matrix. The technique was sensitive enough to discern chemical differences at the grain boundaries and between the ''rosettes'' and the matrix.
1995
M., Labardi; Allegrini, Maria; Fuso, Francesco; F., Leccabue; B. E., Watts; C., Ascoli; C., Frediani
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11568/198491
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