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Die Alleinherrschaft Justinians in der Chronik des Malalas und im Chronicon Paschale: Eine Quellenstudie
2016-01-01 Carrara, Laura
Zwischen Natur und Kultur: Erdbeben als Gegenstand der Altertumswissenschaften. Eine Einleitung
2016-01-01 Carrara, Laura; Borsch, Jonas
Zu den Quellen der Chronik des Johannes Malalas. Eine Einleitung
2017-01-01 Carrara, Laura; Gengler, Olivier
On the relationship between Middle and New Iranian´s lexicon: present state and new perspectives
2012-01-01 Barbati, Chiara
The very worst that could have been chosen’. La funzione dell’exemplum di Titono nell’ Inno Omerico ad Afrodite
2011-01-01 Carrara, Laura
Euripides bei den Grammatikern
2020-01-01 Carrara, Laura
Ivanhoe al cinema e in televisione
2019-01-01 Campanile, MARIA DOMITILLA
Leveraging CMOS Aging for Efficient Microelectronics Design
2020-01-01 Leonel Hernández Martínez, Antonio; Khursheed, Saqib; Rossi, Daniele
Function-inherent code checking: A new low cost on-line testing approach for high performance microprocessor control logic
2008-01-01 Metra, C.; Rossi, D.; Omana, M.; Jas, A.; Galivanche, R.
Model for thermal behavior of shaded photovoltaic cells under hot-spot condition
2011-01-01 Giaffreda, D.; Omana, M.; Rossi, D.; Metra, C.
The other side of the timing equation: A result of clock faults
2005-01-01 Metra, C.; Omana, M.; Rossi, D.; Cazeaux, J. M.; Mak, T. M.
Novel high speed robust latch
2009-01-01 Omana, M.; Rossi, D.; Metra, C.
A novel dual-walled CNT bus architecture with reduced cross-coupling features
2006-01-01 Rossi, D.; Cazeaux, J. M.; Metra, C.; Lombardi, F.
Impact of aging phenomena on soft error susceptibility
2011-01-01 Rossi, D.; Omana, M.; Metra, C.; Paccagnella, A.
Diagnosis of power switches with power-distribution-network consideration
2015-01-01 Tenentes, V.; Rossi, D.; Khursheed, S.; Al-Hashimi, B. M.
Faults affecting the control blocks of PV arrays and techniques for their concurrent detection
2012-01-01 Omana, M.; Rossi, D.; Collepalumbo, G.; Metra, C.; Lombardi, F.
Path (min) delay faults and their impact on self-checking circuits' operation
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High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies
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