The Belle II Experiment at the High Energy Accelerator Research Organization (KEK) in Tsukuba, Japan, will explore the asymmetry between matter and antimatter and search for new physics beyond the standard model.172 double-sided silicon strip detectors are arranged cylindrically in four layers around the collision point to be part of a system which measures the tracks of the collision products of electrons and positrons. A total of 1748 radiation-hard APV25 chips read out 128 silicon strips each and send the analog signals by time-division multiplexing out of the radiation zone to 48 Flash Analog Digital Converter Modules (FADC).Each of them applies processing to the data; for example, it uses a digital finite impulse response filter to compensate line signal distortions, and it extracts the peak timing and amplitude from a set of several data points for each hit, using a neural network.We present an overview of the SVD data readout system, along with front-end electronics, cabling, power supplies and data processing.

The Belle II SVD data readout system

BATIGNANI, GIOVANNI;BETTARINI, STEFANO;CASAROSA, GIULIA;FORTI, FRANCESCO;PALADINO, ANTONIO;PAOLONI, EUGENIO;RIZZO, GIULIANA;
2017-01-01

Abstract

The Belle II Experiment at the High Energy Accelerator Research Organization (KEK) in Tsukuba, Japan, will explore the asymmetry between matter and antimatter and search for new physics beyond the standard model.172 double-sided silicon strip detectors are arranged cylindrically in four layers around the collision point to be part of a system which measures the tracks of the collision products of electrons and positrons. A total of 1748 radiation-hard APV25 chips read out 128 silicon strips each and send the analog signals by time-division multiplexing out of the radiation zone to 48 Flash Analog Digital Converter Modules (FADC).Each of them applies processing to the data; for example, it uses a digital finite impulse response filter to compensate line signal distortions, and it extracts the peak timing and amplitude from a set of several data points for each hit, using a neural network.We present an overview of the SVD data readout system, along with front-end electronics, cabling, power supplies and data processing.
2017
Thalmeier, R; Adamczyk, K.; Aihara, H.; Angelini, C.; Aziz, T.; Babu, V.; Bacher, S.; Bahinipati, S.; Barberio, E.; Baroncelli, T. i.; Baroncelli, T. o.; Basith, A. K.; Batignani, Giovanni; Bauer, A.; Behera, P. K.; Bergauer, T.; Bettarini, Stefano; Bhuyan, B.; Bilka, T.; Bosi, F.; Bosisio, L.; Bozek, A.; Buchsteiner, F.; Bulla, L.; Casarosa, Giulia; Ceccanti, M.; Cervenkov, D.; Chendvankar, S. R.; Dash, N.; Divekar, S. T.; Doleźal, Z.; Dutta, D.; Forti, Francesco; Friedl, M.; Hara, K.; Higuchi, T.; Horiguchi, T.; Irmler, C.; Ishikawa, A.; Jeon, H. B.; Joo, C.; Kandra, J.; Kang, K. H.; Kato, E.; Kawasaki, T.; Kodyś, P.; Kohriki, T.; Koike, S.; Kolwalkar, M. M.; Kvasnićka, P.; Lanceri, L.; Lettenbicher, J.; Lueck, T.; Maki, M.; Mammini, P.; Mayekar, S. N.; Mohanty, G. B.; Mohanty, S.; Morii, T.; Nakamura, K. R.; Natkaniec, Z.; Negishi, K.; Nisar, N. K.; Onuki, Y.; Ostrowicz, W.; Paladino, Antonio; Paoloni, Eugenio; Park, H.; Pilo, F.; Profeti, A.; Rao, K. K.; Rashevskaya, I.; Rizzo, Giuliana; Rozanska, M.; Sasaki, J.; Sato, N.; Schultschik, S.; Schwanda, C.; Seino, Y.; Shimizu, N.; Stypula, J.; Suzuki, J.; Tanaka, S.; Tanida, K.; Taylor, G. N.; Thomas, R.; Tsuboyama, T.; Uozumi, S.; Urquijo, P.; Vitale, L.; Watanuki, S.; Watson, I. J.; Webb, J.; Wiechczynski, J.; Williams, S.; Würkner, B.; Yamamoto, H.; Yin, H.; Yoshinobu, T.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11568/822046
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