A novel methodology for designing Chipless Radio Frequency Identification (RFID) tags is introduced and studied. Leveraging the advantages of Additive Manufacturing (AM) technologies, these tags exhibit a high number of identification states. The designed tags are encoded exploiting the resonances and anti-resonances of its input impedance, specifically utilizing the set of zerocrossing points of its reactance ensuring a robust and unambiguous tag identification, even in the presence of manufacturing tolerances. Furthermore, the inherent flexibility of AM processes, encompassing both 2D and 3D techniques, facilitates the design of highly customized and innovative RFID solutions. This includes the implementation of advanced security features at the physical layer, enhancing the overall security and anticounterfeiting capabilities of the system.

Three-Dimensional Chipless RFID Technology: A New Frontier in Counterfeit Deterrence

Choudhury S.;Costa F.;Manara G.;Genovesi S.
2025-01-01

Abstract

A novel methodology for designing Chipless Radio Frequency Identification (RFID) tags is introduced and studied. Leveraging the advantages of Additive Manufacturing (AM) technologies, these tags exhibit a high number of identification states. The designed tags are encoded exploiting the resonances and anti-resonances of its input impedance, specifically utilizing the set of zerocrossing points of its reactance ensuring a robust and unambiguous tag identification, even in the presence of manufacturing tolerances. Furthermore, the inherent flexibility of AM processes, encompassing both 2D and 3D techniques, facilitates the design of highly customized and innovative RFID solutions. This includes the implementation of advanced security features at the physical layer, enhancing the overall security and anticounterfeiting capabilities of the system.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11568/1346251
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