Silicon electrochemical etching is a well-known technique used for the preparation of both random and ordered porous silicon with tunable pore morphology and size for a wide range of applications [1,2]. However, the preparation of hierarchical networks of pores that synergistically integrate out-of-plane and in-plane pores at different length-scales with potential applications in different fields, e.g. energy storage [3], has not been achieved yet by silicon electrochemical etching. In this work, for the first time, hierarchical network of pores are prepared by back-side illumination electrochemical etching (ECE) of n-type silicon in HF-based electrolytes through controlled inhibition of electric breakdown (BD) at high anodic voltages.

PREPARATION OF HIERARCHICAL NETWORKS OF OUT-OF-PLANE/IN-PLANE PORES BY ELECTROCHEMICAL ETCHING OF SILICON THROUGH CONTROLLED INHIBITION OF BREAKDOWN EFFECTS

COZZI, CHIARA;POLITO, GIOVANNI;STRAMBINI, LUCANOS MARSILIO;BARILLARO, GIUSEPPE
2016-01-01

Abstract

Silicon electrochemical etching is a well-known technique used for the preparation of both random and ordered porous silicon with tunable pore morphology and size for a wide range of applications [1,2]. However, the preparation of hierarchical networks of pores that synergistically integrate out-of-plane and in-plane pores at different length-scales with potential applications in different fields, e.g. energy storage [3], has not been achieved yet by silicon electrochemical etching. In this work, for the first time, hierarchical network of pores are prepared by back-side illumination electrochemical etching (ECE) of n-type silicon in HF-based electrolytes through controlled inhibition of electric breakdown (BD) at high anodic voltages.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11568/842386
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact