We present the X-ray diffraction, polarizing optical microscopy and electrooptic response studies of the chiral liquid crystal siloxane DSi3-MR11 [1] with a de Vries-type behavior. In a wide temperature range (Delta T similar to 50 degrees C) the material shows no layer shrinkage but a weak nearly linear layer spacing variation with temperature. Neither discontinuity nor slope change occurs at the SmA*-SmC* transition. In addition, using the X-ray data, the unusual electrooptic response in both 1st and 2nd harmonics together with known thermal behavior of birefringence, we evidence the cross-over from the classical orthogonal to the de Vries-like SmA* regime in DSi3-MR11 siloxane.

X-ray and electrooptical studies of liquid crystal siloxane with a de Vries SmA* phase

SAMARITANI, SIMONA;GALLI, GIANCARLO;
2006

Abstract

We present the X-ray diffraction, polarizing optical microscopy and electrooptic response studies of the chiral liquid crystal siloxane DSi3-MR11 [1] with a de Vries-type behavior. In a wide temperature range (Delta T similar to 50 degrees C) the material shows no layer shrinkage but a weak nearly linear layer spacing variation with temperature. Neither discontinuity nor slope change occurs at the SmA*-SmC* transition. In addition, using the X-ray data, the unusual electrooptic response in both 1st and 2nd harmonics together with known thermal behavior of birefringence, we evidence the cross-over from the classical orthogonal to the de Vries-like SmA* regime in DSi3-MR11 siloxane.
Goc, F; Blanc, C; Lorman, V; Nobili, M; Samaritani, Simona; Galli, Giancarlo; Kuczynski, W.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11568/101579
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