Performance degradation of integrated circuits due to aging effects, such as Negative Bias Temperature Instability (NBTI), is becoming of great concern for current and future CMOS technology. Here we introduce an aging sensor able to detect such degradations in the combinational part of a critical data-path. It requires lower area than recently proposed alternative solutions, and a lower or comparable power consumption. © 2010 author/owner(s).
Novel low-cost aging sensor
Rossi D.
;
2010-01-01
Abstract
Performance degradation of integrated circuits due to aging effects, such as Negative Bias Temperature Instability (NBTI), is becoming of great concern for current and future CMOS technology. Here we introduce an aging sensor able to detect such degradations in the combinational part of a critical data-path. It requires lower area than recently proposed alternative solutions, and a lower or comparable power consumption. © 2010 author/owner(s).File in questo prodotto:
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