We analyze the impact of clock faults on product quality and operation in the field. We show that clock faults could: i) give rise to min delay violations; ii) compromise the effectiveness of delay fault testing in screening out possible delay faults; iii) be missed by current functional testing (in addition to possibly be missed by structural testing, as proven in [15]). Therefore, new testing/DFT approaches are needed to avoid the dramatic impact of clock faults on product quality and operation in the field. Various possible approaches are discussed. © 2005 IEEE.
The other side of the timing equation: A result of clock faults
Rossi D.;
2005-01-01
Abstract
We analyze the impact of clock faults on product quality and operation in the field. We show that clock faults could: i) give rise to min delay violations; ii) compromise the effectiveness of delay fault testing in screening out possible delay faults; iii) be missed by current functional testing (in addition to possibly be missed by structural testing, as proven in [15]). Therefore, new testing/DFT approaches are needed to avoid the dramatic impact of clock faults on product quality and operation in the field. Various possible approaches are discussed. © 2005 IEEE.File in questo prodotto:
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