New high speed CMOS self-checking voter

Faults possibly affecting voters of TMR systems, employed in high reliability applications, can make them provide the fan-out logic with incorrect data, hence making the adoption of the TMR technique useless. In this paper we instantiate the need for self-checking voters and we propose a new self-checking voting scheme that, compared to alternate self-checking solutions, features the advantage of being faster, while requiring comparable power consumption. This is achieved at the cost of a small increase in area overhead.