A study of the single-photon events generated by the interaction of X-rays up to 60 keV with a true two-phase charge coupled device (CCD) is reported. In particular, a relevant classification of the events is carried out according to their size and collected charge. This classification shows the occurrence of two main groups, characterized by a quite large difference in the ADU values that has been observed between events having different sizes but coming from photons with the same energy. Based upon 2D numerical calculations accounting for the charge cloud dynamics, diffusion and recombination, an explanation is suggested for this difference, arising from the difference in the electric field strength in the point of initial interaction. Moreover, the relative abundance of these two groups was found to be energy dependent. A model accounting for the true two-phase pixel structure was found to be a valid tool for a correct prediction of this abundance and an enhanced reconstruction of the spectra of the impinging photons. (C) 2008 Elsevier B.V. All rights reserved.
|Autori interni:||GIULIETTI, DANILO|
|Autori:||Levato T; Labate L; Galimberti M; Giulietti A; Giulietti D; Gizzi LA|
|Titolo:||Detailed analysis of events from high-energy X-ray photons impinging on a two-phase front-illuminated CCD|
|Anno del prodotto:||2008|
|Digital Object Identifier (DOI):||10.1016/j.nima.2008.04.011|
|Appare nelle tipologie:||1.1 Articolo in rivista|