We perform a measurement of time-dependent $CP$ violation parameters in $B^{0} \to K_{S}^{0} π^{0} γ$ decays using a dataset of approximately $772 \times 10^6$ and $521 \times 10^6$ $Υ(4S)$ decays collected by the Belle and Belle II experiments, respectively. The measured parameters for the combined dataset in the $K^{*0}(892)$ dominated region ($M_{K_{S}^{0} π^{0}} \in [0.8,1.0] \mathrm{GeV}/c^2$) are $S = 0.09 \pm 0.16 \pm 0.02$ and $C = -0.09 \pm 0.08 \pm 0.04$. For the non-$K^{*0}(892)$ region ($M_{K_{S}^{0} π^{0}} \in [1.0,1.8] \mathrm{GeV}/c^2$), the corresponding values are $S = -0.32 \pm 0.33 \pm 0.09$ and $C = -0.07 \pm 0.17 \pm 0.08$. The first quoted uncertainties are statistical, while the second ones are systematic. These results are consistent with Standard Model predictions and more precise than previous measurements.
Measurement of time-dependent $CP$ violation parameters in $B^{0} \to K_{S}^{0} π^{0} γ$ decays at Belle and Belle II
Benfratello, G. F.;Bertacchi, V.;Bettarini, S.;Bussino, S.;Carminati, M.;Casarosa, G.;Cho, K.;Choudhury, S.;Corona, L.;de Marino, G.;De Pietro, G.;Forti, F.;Lueck, T.;Massaccesi, L.;Moneta, S.;Rizzo, G.;Salutari, L.;Trantou, F. F.;Zani, L.;
2026-01-01
Abstract
We perform a measurement of time-dependent $CP$ violation parameters in $B^{0} \to K_{S}^{0} π^{0} γ$ decays using a dataset of approximately $772 \times 10^6$ and $521 \times 10^6$ $Υ(4S)$ decays collected by the Belle and Belle II experiments, respectively. The measured parameters for the combined dataset in the $K^{*0}(892)$ dominated region ($M_{K_{S}^{0} π^{0}} \in [0.8,1.0] \mathrm{GeV}/c^2$) are $S = 0.09 \pm 0.16 \pm 0.02$ and $C = -0.09 \pm 0.08 \pm 0.04$. For the non-$K^{*0}(892)$ region ($M_{K_{S}^{0} π^{0}} \in [1.0,1.8] \mathrm{GeV}/c^2$), the corresponding values are $S = -0.32 \pm 0.33 \pm 0.09$ and $C = -0.07 \pm 0.17 \pm 0.08$. The first quoted uncertainties are statistical, while the second ones are systematic. These results are consistent with Standard Model predictions and more precise than previous measurements.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.


