We have performed systematic measurements on a W-Ni MIM point contact diode at different IR, FIR, and IF frequencies in order to investigate the mechanisms responsible for the different response times observed in the diode operation. Our results led to the experimental confirmation of a second effect of thermal nature, besides tunnel effect, responsible for the diode operation. We measure the cutoff frequency of this second effect, which results in good agreement with our theoretical interpretation.
|Autori:||CARELLI G; INGUSCIO M; IOLI N; MORETTI A; PREVEDELLI M; STRUMIA F; PEREIRA D|
|Titolo:||ON THE WORK MECHANISM OF MIM POINT CONTACT DIODES|
|Anno del prodotto:||1992|
|Digital Object Identifier (DOI):||10.1007/BF01009053|
|Appare nelle tipologie:||1.1 Articolo in rivista|