Polymer-metal granular thin films were grown by simultaneous ion beam sputtering from a composite target. Morphological analysis performed by transmission electron microscopy shows their granular fine structure. The samples' ageing process was monitored over an interval of many hours after the film deposition. A detailed study of the resistance vs. temperature behaviour was performed over the range 12-300 K; current-voltage measurements as a function of temperature are also reported. An unusual ln(R) proportional T-1 dependence was found at low temperature. This behaviour is explained with theoretical arguments based on percolation theory.
|Autori interni:||BRUSCHI, PAOLO|
|Autori:||BRUSCHI P; NANNINI A; MASSARA F|
|Titolo:||LOW-TEMPERATURE BEHAVIOR OF ION-BEAM-GROWN POLYMER METAL COMPOSITE THIN-FILMS|
|Anno del prodotto:||1991|
|Digital Object Identifier (DOI):||10.1016/0040-6090(91)90363-3|
|Appare nelle tipologie:||1.1 Articolo in rivista|