Polymer-metal granular thin films were grown by simultaneous ion beam sputtering from a composite target. Morphological analysis performed by transmission electron microscopy shows their granular fine structure. The samples' ageing process was monitored over an interval of many hours after the film deposition. A detailed study of the resistance vs. temperature behaviour was performed over the range 12-300 K; current-voltage measurements as a function of temperature are also reported. An unusual ln(R) proportional T-1 dependence was found at low temperature. This behaviour is explained with theoretical arguments based on percolation theory.

LOW-TEMPERATURE BEHAVIOR OF ION-BEAM-GROWN POLYMER METAL COMPOSITE THIN-FILMS

BRUSCHI, PAOLO;NANNINI, ANDREA;
1991-01-01

Abstract

Polymer-metal granular thin films were grown by simultaneous ion beam sputtering from a composite target. Morphological analysis performed by transmission electron microscopy shows their granular fine structure. The samples' ageing process was monitored over an interval of many hours after the film deposition. A detailed study of the resistance vs. temperature behaviour was performed over the range 12-300 K; current-voltage measurements as a function of temperature are also reported. An unusual ln(R) proportional T-1 dependence was found at low temperature. This behaviour is explained with theoretical arguments based on percolation theory.
1991
Bruschi, Paolo; Nannini, Andrea; Massara, F.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11568/173983
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