In the last years several hundreds of large (similar to 25 cm(2)) double-sided silicon strip detectors have been designed and tested in our Pisa-INFN laboratory. These detectors are currently used in ALEPH and L3 vertices, and in other field of applications as well. We present the tests performed on a single detector, and we discuss some results on the test structures inserted in each wafer in order to measure the relevant, process-dependent, quantities which determine the detector performances.
DOUBLE-SIDED SILICON STRIP DETECTORS IN PISA
BATIGNANI, GIOVANNI;FORTI, FRANCESCO;GIORGI, MARCELLO;RIZZO, GIULIANA;TONELLI, GUIDO EMILIO;TRIGGIANI, GIUSEPPE
1995-01-01
Abstract
In the last years several hundreds of large (similar to 25 cm(2)) double-sided silicon strip detectors have been designed and tested in our Pisa-INFN laboratory. These detectors are currently used in ALEPH and L3 vertices, and in other field of applications as well. We present the tests performed on a single detector, and we discuss some results on the test structures inserted in each wafer in order to measure the relevant, process-dependent, quantities which determine the detector performances.File in questo prodotto:
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