The power spectral density of low frequency resistance fluctuation in heterocyclic conducting polymer thin film resistors was measured at various temperatures and bias current values. An accurate calculation of the background noise was performed in order to correct the measured power spectral densities. A parameter obtained normalizing the voltage power density to the sample volume and d.c. bias is used to compare the tested conducting polymers with various materials used for resistors fabrication.
Flicker noise in heterocyclic conducting polymer thin film resistors
BRUSCHI, PAOLO;NANNINI, ANDREA;PIOTTO, MASSIMO
2002-01-01
Abstract
The power spectral density of low frequency resistance fluctuation in heterocyclic conducting polymer thin film resistors was measured at various temperatures and bias current values. An accurate calculation of the background noise was performed in order to correct the measured power spectral densities. A parameter obtained normalizing the voltage power density to the sample volume and d.c. bias is used to compare the tested conducting polymers with various materials used for resistors fabrication.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
