NiTi films deposited by pulsed laser ablation on Si/SiO(2) are shown to exhibit structural and functional properties related to the shape-memory effect. Film characterization suggests that relevant temperatures for the solid-to-solid transformation responsible for the shape memory are in substantial agreement with those of the bulk target material, demonstrating a good congruency of the deposition process. Besides the technological interest for this class of thin films, our findings point out the suitability of laser ablation for metal alloy deposition. An investigation based on in situ ion-mass spectroscopy and covariance mapping analysis allows us to determine the main vapor-phase processes leading to the formation of stoichiometric clusters expected to play a relevant role in assisting the growth of NiTi thin films.
|Autori:||A. CAMPOSEO; F. FUSO; ARIMONDO E; A. TUISSI|
|Titolo:||Pulsed laser deposition and in situ diagnostics of the process applied to shape-memory alloys|
|Anno del prodotto:||2003|
|Digital Object Identifier (DOI):||10.1007/s00339-002-1445-1|
|Appare nelle tipologie:||1.1 Articolo in rivista|