In the standard version of the EGS4 code system, the equivalent K-edge of a compound is assumed to be the weighted average of the K-edge of each element in the compound. This implies that the energy of both the fluorescent photon and the photoelectron is not correct, hence inaccurate EGS4 simulations of energy scoring in the compound material may be produced in the low-energy range (10-100 keV). In this report we show a technique that we used to overcome this problem. The same technique can also be used to introduce L-edge sampling in EGS4. An application of this sampling method to HgI2 compound is shown.
|Autori:||DEL GUERRA A; NELSON WR; RUSSO P|
|Titolo:||A SIMPLE METHOD TO INTRODUCE K-EDGE SAMPLING FOR COMPOUNDS IN THE CODE EGS4 FOR X-RAY ELEMENT ANALYSIS|
|Anno del prodotto:||1991|
|Digital Object Identifier (DOI):||10.1016/0168-9002(91)90344-P|
|Appare nelle tipologie:||1.1 Articolo in rivista|