A scanning friction force microscope has been used to study the surfaces of lead zirconate titanate thin films prepared by sol-gel and pulsed laser ablation. As well as mapping the topography of the films the friction force has proven to be a sensitive tool which can be used to detect compositional changes. Although the laser deposited films had some larger defects up to 500 nm, the grains had a smooth texture (roughness approximate to 2-5 nm). Sol-gel films had grain sizes of the order of 150 nm and roughness of 20-50 nm. Zirconium rich films also had ''rosettes'' approximately 1 mu m in diameter and raised 200 nm above the surrounding matrix. The technique was sensitive enough to discern chemical differences at the grain boundaries and between the ''rosettes'' and the matrix.
|Autori:||M. Labardi; M. Allegrini; F. Fuso; F. Leccabue; B.E. Watts; C. Ascoli; C. Frediani|
|Titolo:||Scanning and Friction Force Microscopy (SFFM) of Ferroelectric Pb(Zr,Ti)O3 Thin Films|
|Anno del prodotto:||1995|
|Digital Object Identifier (DOI):||10.1080/10584589508012308|
|Appare nelle tipologie:||1.1 Articolo in rivista|