Noncontact friction force microscopy (NC-FFM) measures the damping of the resonant oscillation of an atomic force microscope (AFM) tip that vibrates parallel to the sample surface at a controlled distance. By exploiting the two fundamental orthogonal vibration modes of a quartz tuning fork, such technique can be realized by all-piezoelectric sensing by simultaneously employing an AFM noncontact mode for distance control. The low noncontact-mode vibration amplitude used increases the effective interaction time for shear measurement. Application to polymeric samples shows that the dissipation contrast of NC-FFM is higher than that of the corresponding noncontact-mode phase imaging. (c) 2006 American Institute of Physics.

Noncontact friction force microscopy based on quartz tuning fork sensors

ALLEGRINI, MARIA
2006

Abstract

Noncontact friction force microscopy (NC-FFM) measures the damping of the resonant oscillation of an atomic force microscope (AFM) tip that vibrates parallel to the sample surface at a controlled distance. By exploiting the two fundamental orthogonal vibration modes of a quartz tuning fork, such technique can be realized by all-piezoelectric sensing by simultaneously employing an AFM noncontact mode for distance control. The low noncontact-mode vibration amplitude used increases the effective interaction time for shear measurement. Application to polymeric samples shows that the dissipation contrast of NC-FFM is higher than that of the corresponding noncontact-mode phase imaging. (c) 2006 American Institute of Physics.
Labardi, M; Allegrini, Maria
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11568/199256
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