The residual stress field in 7wt% yttria partially stabilised zirconia (Y-PSZ) plasma sprayed (300-mu m thick) coatings on Al substrates was studied by means of two different techniques: X-ray residual stress analysis (XRSA), and elongation and curvature measurement after substrate removal (CD), Results were considerably improved with respect to conventional XRSA, by using a synchrotron radiation source and specifically designed high resolution optics: an extended beam penetration, achieved by using different wavelengths down to 0.94 Angstrom allowed the determination of the strain field in the outer similar to 50 mu m of the ceramic. XRSA (surface) and CD (volume averaged) strain data were analysed by a mechanical model of the coated component capable of intergrating the results of both techniques. The procedure, designed to appropriately consider the different nature of the information coming from the two measurement techniques, permitted us to study the residual stress distribution through the entire Y-PSZ coating thickness. In particular, it pointed out the presence of a considerable stress gradient in the surface region of the ceramic. (C) 1997 Elsevier Science S.A.
|Autori:||Scardi P; Leoni M; Bertini L; Bertamini L|
|Titolo:||Residual stress in partially-stabilised-zirconia TBCs: experimental measurement and modelling RID A-9634-2010|
|Anno del prodotto:||1997|
|Digital Object Identifier (DOI):||10.1016/S0257-8972(97)00482-9|
|Appare nelle tipologie:||1.1 Articolo in rivista|