La-modified PbTiO3 (PLT) thin films of different composition (Pb1-3x/2LaxTiO3 , x=0.15 and 0.20) were characterized by Piezoresponse Force Microscopy (PFM). 001/100-textured films were deposited on (111)Pt/TiO2/SiO2/(100)Si by Pulsed Laser Deposition (PLD). The spontaneous polarization domain structure was correlated with the grain microstructure and orientation texture. The area ratio between the 001 and -001 antiparallel polarization domains was estimated. Additionally, the local piezoelectric behavior in PLT (x=0.15) films was characterized.

Ferroelectric Domain Structure and Local Piezoelectric Properties of La-Modified PbTiO3 Thin Films Prepared by Pulsed Laser Deposition

ALLEGRINI, MARIA;
2002-01-01

Abstract

La-modified PbTiO3 (PLT) thin films of different composition (Pb1-3x/2LaxTiO3 , x=0.15 and 0.20) were characterized by Piezoresponse Force Microscopy (PFM). 001/100-textured films were deposited on (111)Pt/TiO2/SiO2/(100)Si by Pulsed Laser Deposition (PLD). The spontaneous polarization domain structure was correlated with the grain microstructure and orientation texture. The area ratio between the 001 and -001 antiparallel polarization domains was estimated. Additionally, the local piezoelectric behavior in PLT (x=0.15) films was characterized.
2002
C., Polop; E., Vasco; M., Labardi; C., Zaldo; Allegrini, Maria; C., Ocal
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11568/74512
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