The uncertainties on the mistagged NTMJ background include the statis- tical uncertainty on the sample after loose selection, to which the mistag probability is applied; the statistical uncertainty on the mistag proba- bility itself, ranging from <1% at 1TeV/c2 to ≈10% at 3TeV/c2; and the systematic uncertainty on the mistag probability application, as de- scribed in section 3.3, which is in the range of 1 to 5% depending on the tt ̄ mass. The total background uncertainty is ≈5% for the low-mass region, dominated by the systematic uncertainty, and ≈100% for the high-mass region, dominated by statistical uncertainty associated with the sample after loose selection.

Search for anomalous production in the highly-boosted all-hadronic final state (vol 09, 029, 2012)

Bianchini, L.;Calligaris, L.;MARTINI, LUCA;MESSINEO, ALBERTO MARIA;RIZZI, ANDREA;TONELLI, GUIDO EMILIO;
2014-01-01

Abstract

The uncertainties on the mistagged NTMJ background include the statis- tical uncertainty on the sample after loose selection, to which the mistag probability is applied; the statistical uncertainty on the mistag proba- bility itself, ranging from <1% at 1TeV/c2 to ≈10% at 3TeV/c2; and the systematic uncertainty on the mistag probability application, as de- scribed in section 3.3, which is in the range of 1 to 5% depending on the tt ̄ mass. The total background uncertainty is ≈5% for the low-mass region, dominated by the systematic uncertainty, and ≈100% for the high-mass region, dominated by statistical uncertainty associated with the sample after loose selection.
2014
Chatrchyan, S.; Khachatryan, V.; Sirunyan, A. M.; Tumasyan, A.; Adam, W.; Bergauer, T.; Dragicevic, M.; Eroe, J.; Fabjan, C.; Friedl, M.; Fruehwirth, ...espandi
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11568/768524
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