In the last decade Raman spectroscopy was used for routine investigation in the characterization of gems,[1] as it offers many advantages for gemological purposes being nondestructive and noninvasive and granting short measurement times, low amount of material and no sample preparation. In this context, this work is focused on the spectroscopic characterization of different kinds of sapphires, by using handheld Raman instrumentation, in order to furnish gemological certification and to acquire information about the provenance of the gems. In particular, the aim of the present study is to distinguish between natural and synthetic sapphire and identify imitations gems. The Raman spectra are collected by means of a portable MiniRam™ series spectrometer (MADAtec) using a wavelength of 785 nm as excitation source, in the spectral range 175 – 3150cm-1. In order to perform further and deeper analysis on some selected samples, in particular for the characterization of the inclusions, a confocal JobinYvon Horiba Labram, equipped with the 632.8 nm and 473.1 nm excitation lines, is used. The obtained data could improve the existing databases of gem spectra recently built and wide available also in the Web.[2–5] References [1] D. Bersani, P. P. Lottici, Anal. Bioanal. Chem. 2010, 397, 2631–2646. [2] RRUFF Project (2010) Department of Geosciences, University of Arizona, Tucson, USA. http://rruff.info/. Accessed 01 Mar 2013. [3] Minerals Raman Database (2010) Physics Department, University of Parma, Italy. http://www.fis.unipr.it/ phevix/ramandb.php. Accessed 01 Mar 2013. [4] Handbook of Minerals Raman Spectra (2010) Ecole normale supérieure de Lyon, Lyon. http://www.enslyon.fr/LST/Raman/index.php. Accessed 01 Mar 2013. [5] Raman spectra database, Dipartimento di Scienze della Terra, Università di Siena (2010). http://www.dst. unisi.it/geofluids/raman/spectrum_frame.htm. Accessed01 Mar 2013.
Raman Spectroscopy as useful tool for the gemmological certification and provenance determination of sapphires
RANERI, SIMONA;
2013-01-01
Abstract
In the last decade Raman spectroscopy was used for routine investigation in the characterization of gems,[1] as it offers many advantages for gemological purposes being nondestructive and noninvasive and granting short measurement times, low amount of material and no sample preparation. In this context, this work is focused on the spectroscopic characterization of different kinds of sapphires, by using handheld Raman instrumentation, in order to furnish gemological certification and to acquire information about the provenance of the gems. In particular, the aim of the present study is to distinguish between natural and synthetic sapphire and identify imitations gems. The Raman spectra are collected by means of a portable MiniRam™ series spectrometer (MADAtec) using a wavelength of 785 nm as excitation source, in the spectral range 175 – 3150cm-1. In order to perform further and deeper analysis on some selected samples, in particular for the characterization of the inclusions, a confocal JobinYvon Horiba Labram, equipped with the 632.8 nm and 473.1 nm excitation lines, is used. The obtained data could improve the existing databases of gem spectra recently built and wide available also in the Web.[2–5] References [1] D. Bersani, P. P. Lottici, Anal. Bioanal. Chem. 2010, 397, 2631–2646. [2] RRUFF Project (2010) Department of Geosciences, University of Arizona, Tucson, USA. http://rruff.info/. Accessed 01 Mar 2013. [3] Minerals Raman Database (2010) Physics Department, University of Parma, Italy. http://www.fis.unipr.it/ phevix/ramandb.php. Accessed 01 Mar 2013. [4] Handbook of Minerals Raman Spectra (2010) Ecole normale supérieure de Lyon, Lyon. http://www.enslyon.fr/LST/Raman/index.php. Accessed 01 Mar 2013. [5] Raman spectra database, Dipartimento di Scienze della Terra, Università di Siena (2010). http://www.dst. unisi.it/geofluids/raman/spectrum_frame.htm. Accessed01 Mar 2013.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
