In this paper we review the basics of optical investigations with a spatial resolution beyond the diffraction limit. Scanning Near-field Optical Microscopy (SNOM) is shown to be a powerful and sensitive tool, able to transfer a wealth of conventional microscopy methods into the realm of the nanoworld. In particular, integration of SNOM with polarization-modulation methods enables analyzing and measuring optical activity at the nanoscale in solid-state samples. A few examples are presented to elucidate the potential of the technique in analyzing organic nanostructures showing linear and circular dichroism and in unraveling conformational and structural details
Nanoscopy beyond the diffraction limit
Maria Allegrini;Francesco Fuso
2016-01-01
Abstract
In this paper we review the basics of optical investigations with a spatial resolution beyond the diffraction limit. Scanning Near-field Optical Microscopy (SNOM) is shown to be a powerful and sensitive tool, able to transfer a wealth of conventional microscopy methods into the realm of the nanoworld. In particular, integration of SNOM with polarization-modulation methods enables analyzing and measuring optical activity at the nanoscale in solid-state samples. A few examples are presented to elucidate the potential of the technique in analyzing organic nanostructures showing linear and circular dichroism and in unraveling conformational and structural detailsI documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.