In the future Belle II experiment at the SuperKEKB collider in Tsukuba, Japan, charged particle tracking in the vicinity of the e+e- interaction point is provided by a two-layer silicon pixel detector based on the novel DEPFET technology (PXD) and by a four-layer silicon strip detector (SVD). In this presentation, I review the technology and the design of these two devices, and describe the current state of their construction.
Inner tracking devices at the belle II experiment
Casarosa, Giulia
2015-01-01
Abstract
In the future Belle II experiment at the SuperKEKB collider in Tsukuba, Japan, charged particle tracking in the vicinity of the e+e- interaction point is provided by a two-layer silicon pixel detector based on the novel DEPFET technology (PXD) and by a four-layer silicon strip detector (SVD). In this presentation, I review the technology and the design of these two devices, and describe the current state of their construction.File in questo prodotto:
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