Sfoglia per Autore
Characterization and diagnostics of VLSI microstrucures
1990-01-01 Bagnoli, PAOLO EMILIO; Basso, Giovanni; C., Ciofi; A., Diligenti; Macucci, Massimo; M., Mul; Neri, Bruno; Pellegrini, Bruno
A new measurement method of MOS transistor parameters
1990-01-01 Ciofi, Carmine; Macucci, Massimo; Pellegrini, Bruno
Reverse current-voltage characteristic of almost ideal silicon p-n junctions
1991-01-01 Pellegrini, Bruno
Four–state traps in almost ideal p–n junction
1991-01-01 Pellegrini, Bruno; Basso, Giovanni
Accurate Measurement of Shot and Thermal Noise in p-n Junctions over Seven Current Decades
1991-01-01 Macucci, Massimo; Pellegrini, Bruno
ULTRA LOW-NOISE PREAMPLIFIER FOR LOW-FREQUENCY NOISE MEASUREMENTS IN ELECTRON DEVICES
1991-01-01 Neri, Bruno; Pellegrini, Bruno; Saletti, Roberto
Very sensitive measurement method of electron devices current noise
1991-01-01 Macucci, Massimo; Pellegrini, Bruno
A simplified and improved model of ideal and almost ideal silicon p-n junctions: the role of oxygen
1992-01-01 Pellegrini, Bruno
Splitting of Electron Current Pulses and Noise in Double-Barrier Heterostructures
1993-01-01 Pellegrini, Bruno; Macucci, Massimo
On Noise Suppression in Double-Barrier Devices and in Quantum Point Contacts
1993-01-01 Macucci, Massimo; Pellegrini, Bruno
Spectrometry of very long-current transients in almost ideal silicon p-n junctions
1993-01-01 Basso, Giovanni; Pellegrini, Bruno; Polignano, Ml
Shot noise reduction in double–barrier resonant–tunneling structures
1994-01-01 Ciambrone, P; Macucci, Massimo; Iannaccone, Giuseppe; Pellegrini, Bruno; Lazzarino, M; Sorba, L; Beltram, F.
Approaches to the tunneling time based on the Larmor clock and particle absorption as particular cases of the stay-time method
1994-01-01 Iannaccone, Giuseppe; Pellegrini, Bruno
Characteristic times in the motion of a particle
1994-01-01 Iannaccone, Giuseppe; Pellegrini, Bruno
Unified approach to electron transport in double-barrier structures
1995-01-01 Iannaccone, Giuseppe; Pellegrini, Bruno
Effects of displacement current on quantum noise
1995-01-01 Pellegrini, Bruno; Macucci, Massimo; Iannaccone, Giuseppe
Effect of displacement current on quantum noise
1995-01-01 Pellegrini, Bruno; Macucci, Massimo; Iannaccone, Giuseppe
Photocurrent transients in almost ideal silicon p-n junctions
1995-01-01 Basso, Giovanni; Pellegrini, Bruno
Noise Measurements in Resonant Tunneling Diodes as a Function of Current and Temperature
1995-01-01 Ciambrone, P.; Macucci, Massimo; Iannaccone, Giuseppe; Pellegrini, Bruno; Lazzarino, M.; Sorba, L.; Beltram, F.
Compact formula for the density of states in a quantum well
1996-01-01 Iannaccone, Giuseppe; Pellegrini, Bruno
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