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Titolo Data di pubblicazione Autore(i) File
Noise in Almost Ideal n+-p Junctions 1-gen-1997 Basso, Giovanni; Pellegrini, Bruno
Temperature dependence of shot noise in resonant tunneling structures 1-gen-1997 Iannaccone, Giuseppe; Macucci, Massimo; Pellegrini, Bruno
Shot-noise dependence on barrier symmetry in resonant-tunneling diodes 1-gen-1997 G., Lombardi; Macucci, Massimo; Iannaccone, Giuseppe; Pellegrini, Bruno
Theory of conductance and noise additivity in parallel mesoscopic conductors 1-gen-1997 Iannaccone, Giuseppe; Macucci, Massimo; Pellegrini, Bruno
Shot noise in resonant-tunneling structures 1-gen-1997 Iannaccone, Giuseppe; Macucci, Massimo; Pellegrini, Bruno
Theory of Conductance and noise additivity in parallel mesoscopic conductors 1-gen-1997 Iannaccone, Giuseppe; Macucci, Massimo; Pellegrini, Bruno
A versatile cryogenic temperature controller 1-gen-1998 Oppo, G; Giannetti, Romano; Macucci, Massimo; Pellegrini, Bruno
Enhanced Shot Noise in Resonant Tunneling: Theory and Experiment 1-gen-1998 Iannaccone, Giuseppe; Lombardi, G.; Macucci, Massimo; Pellegrini, Bruno
Cryogenic amplification system for ultra-low noise measurements 1-gen-1998 Lombardi, G; Macucci, Massimo; Giannetti, Romano; Pellegrini, Bruno
Modeling of shot noise in resonant tunneling structures 1-gen-1998 Iannaccone, Giuseppe; Macucci, Massimo; Pellegrini, Bruno
Coulomb breach effect emerging in shot noise 1-gen-1999 Iannaccone, Giuseppe; G., Lombardi; Macucci, Massimo; Pellegrini, Bruno
Is 1/fγ noise an usolved problem? 1-gen-1999 Pellegrini, Bruno
Signatures of Electron-Electron Interaction in Nanoelectronic Device Shot Noise 1-gen-1999 Iannaccone, Giuseppe; Macucci, Massimo; Pellegrini, Bruno
Quantum-Mechanical Simulation of Shot Noise in the Elastic Diffusive Regime 1-gen-1999 Macucci, Massimo; Iannaccone, Giuseppe; Pellegrini, Bruno
Shape of the tunneling conductance peaks for coupled electron waveguides 1-gen-2000 M., Governale; Macucci, Massimo; Pellegrini, Bruno
A general model of 1/f^{gamma} noise 1-gen-2000 Pellegrini, Bruno
Signatures of electron-electron interaction in nanoelectronic device shot noise 1-gen-2000 Iannaccone, Giuseppe; Macucci, Massimo; Pellegrini, Bruno
Signatures of electron-electron interaction in nanoelectronic device shot noise 1-gen-2000 Iannaccone, Giuseppe; Macucci, Massimo; Pellegrini, Bruno
Simulation and measurement of shot noise in resonant tunneling structures 1-gen-2000 Iannaccone, Giuseppe; G., Lombardi; Macucci, Massimo; C., Ciofi; Pellegrini, Bruno
Three-dimensional statistical modeling of the effects of the random distribution of dopants in deep sub-micron nMOSFETs 1-gen-2001 E., Amirante; Iannaccone, Giuseppe; Pellegrini, Bruno
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