CIOFI, CARMINE Statistiche
CIOFI, CARMINE
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Risultati 1 - 4 di 4 (tempo di esecuzione: 0.012 secondi).
Noise and Fluctuations in Circuits, Devices, and Materials
2007-01-01 Macucci, Massimo; Vandamme, L. K.; Ciofi, Carmine; Weissman, M. B.
Thin films of granular silicon: Electrical, structural and optical characterization
1997-01-01 Ciofi, Carmine; Diligenti, Alessandro; Nannini, Andrea; Pennelli, Giovanni; Vannucci, N; Fuso, Francesco; Allegrini, Maria
Characterization of YSZ Films by means of C-V Measurements and TEM Observations
1995-01-01 Bagnoli, PAOLO EMILIO; Ciofi, Carmine; Diligenti, Alessandro; A., Innamorato; Nannini, Andrea
A new measurement method of MOS transistor parameters
1990-01-01 Ciofi, Carmine; Macucci, Massimo; Pellegrini, Bruno
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Noise and Fluctuations in Circuits, Devices, and Materials | 1-gen-2007 | Macucci, Massimo; Vandamme, L. K.; Ciofi, Carmine; Weissman, M. B. | |
| Thin films of granular silicon: Electrical, structural and optical characterization | 1-gen-1997 | Ciofi, Carmine; Diligenti, Alessandro; Nannini, Andrea; Pennelli, Giovanni; Vannucci, N; Fuso, Francesco; Allegrini, Maria | |
| Characterization of YSZ Films by means of C-V Measurements and TEM Observations | 1-gen-1995 | Bagnoli, PAOLO EMILIO; Ciofi, Carmine; Diligenti, Alessandro; A., Innamorato; Nannini, Andrea | |
| A new measurement method of MOS transistor parameters | 1-gen-1990 | Ciofi, Carmine; Macucci, Massimo; Pellegrini, Bruno |