A 114 ppm/∘C-TC 0.78%-(σ/μ) Current Reference With Minimum-Current-Search Calibration

Accuracy and stability of current references (CRs) represent challenging requirements in modern analog integrated design, dictating the need for PVT-insensitive implementations. In this work, we investigate a solution relying on the combination of analog CR topologies with an automatic on-chip temperature calibration, based on a minimum-current-search principle. The proposed algorithm does not require explicit temperature sensing and allows improving the temperature coefficient (TC) by a factor of 3 with respect to the analog core. The CR circuit was designed in 0.18 m CMOS for an output current of 469 nA. Mixed-signal simulations resulted in a TC of 114 ppm/∘C (averaged across 200 Monte Carlo runs) and in a relative standard deviation of 0.78% for the reference current, which are competitive results compared with the state of the art.