A computerized optical measuring system for the surface characterization of different materials of widespread use, mainly stones, is described. The initiative of developing such system arose from three main needs: • performing analyses of surfaces having geometrical irregularities which cannot be easily detected with traditional stylus contact profilometry; • analyzing and processing the data acquired in electronic format; • speeding up and automating the whole measuring process on a large scale. The developed system performs different types of measures on the acquired data, furthermore the integration of an optical profilometer and a stylus texture measuring instrument allows extending the types of materials which can be analyzed. The system components, including numerically controlled sample motion and automated data acquisition, are computer integrated by a specifically designed program.
Rilievo micrometrico di superfici con metodi ottici
LANZETTA, MICHELE;TANTUSSI, GIOVANNI;
2008-01-01
Abstract
A computerized optical measuring system for the surface characterization of different materials of widespread use, mainly stones, is described. The initiative of developing such system arose from three main needs: • performing analyses of surfaces having geometrical irregularities which cannot be easily detected with traditional stylus contact profilometry; • analyzing and processing the data acquired in electronic format; • speeding up and automating the whole measuring process on a large scale. The developed system performs different types of measures on the acquired data, furthermore the integration of an optical profilometer and a stylus texture measuring instrument allows extending the types of materials which can be analyzed. The system components, including numerically controlled sample motion and automated data acquisition, are computer integrated by a specifically designed program.File | Dimensione | Formato | |
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