A computerized optical measuring system for the surface characterization of different materials of widespread use, mainly stones, is described. The initiative of developing such system arose from three main needs: • performing analyses of surfaces having geometrical irregularities which cannot be easily detected with traditional stylus contact profilometry; • analyzing and processing the data acquired in electronic format; • speeding up and automating the whole measuring process on a large scale. The developed system performs different types of measures on the acquired data, furthermore the integration of an optical profilometer and a stylus texture measuring instrument allows extending the types of materials which can be analyzed. The system components, including numerically controlled sample motion and automated data acquisition, are computer integrated by a specifically designed program.
|Autori:||LANZETTA M; TANTUSSI GIOVANNI; ZAMBARDI VALERIO|
|Titolo:||Rilievo micrometrico di superfici con metodi ottici|
|Anno del prodotto:||2008|
|Appare nelle tipologie:||1.1 Articolo in rivista|