Two types of insulated metal substrates for surface mounting technology (SMT) for automotive applications were thermally examined by means of the TRAIT method [P.E. Bagnoli, C. Casarosa, M. Ciampi, E. Dallago, Thermal resistance analysis by induced transient (TRAIT) method for power electronic devices thermal characterization. Part I: fundamentals and theory, IEEE Transactions on Power Electronics 13 (1998) 1208–1219]. The results showed a noticeably lower static thermal resistance than other solutions commonly used. Moreover, TRAIT analysis provided evidence that the residue thermal resistance has to be ascribed to the epoxy insulating layer of the IMS substrates, suggesting that the differences between different types of IMS substrates are due to differences in the dielectric deposition technology.
|Autori:||DI PASCOLI S; CASAROSA C.; BAGNOLI P.E.|
|Titolo:||Thermal analysis of insulated metal substrates for automotive electronic assemblies|
|Anno del prodotto:||1999|
|Digital Object Identifier (DOI):||10.1016/S0026-2692(99)00075-0|
|Appare nelle tipologie:||1.1 Articolo in rivista|