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BAGNOLI, PAOLO EMILIO Statistiche

BAGNOLI, PAOLO EMILIO  

DIPARTIMENTO DI INGEGNERIA DELL'INFORMAZIONE  

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Risultati 1 - 20 di 107 (tempo di esecuzione: 0.153 secondi).
Titolo Data di pubblicazione Autore(i) File
A modeling methodology for thermal analysis of the PCB structure 1-gen-2014 Zhang, Yabin; Bagnoli, PAOLO EMILIO
A numerical tool for thermo-mechanical analysis of multilayer stepped structures 1-gen-2013 Bagnoli, PAOLO EMILIO; Maria, Girardi; Cristina, Padovani; Pasquinelli, Giuseppe
A study of electromigrations in aluminum and aluminum-silicon thin film resistors using noise technique 1-gen-1989 Diligenti, Alessandro; Bagnoli, PAOLO EMILIO; Neri, Bruno; S., Bea; L., Mantellassi
A Thermomechanical Solver for Multilayer Power Electronic Assemblies Integrated Into the DJOSER Thermal Simulator 1-gen-2011 Bagnoli, PAOLO EMILIO; Padovani, C.; Pagni, A.; Pasquinelli, G.
ABSOLUTE DATING OF ROCK ART ON FLAT MARBLE SURFACES 1-gen-2009 Bagnoli, PAOLO EMILIO
AC series voltage regulator for Permanent Magnet Generators 1-gen-2010 Pennatini, A.; Bagnoli, PAOLO EMILIO; Franchi, E.
Alkaline ion sensitivity of insulator/silicon structures with glass membrane prepared by sol-gel technique 1-gen-1991 Bagnoli, PAOLO EMILIO; M., Guglielmi; P., Colombo
Analysis of heat conduction properties of packaged laser diodes from highly resolved temperature transient measurements 1-gen-1999 Bagnoli, PAOLO EMILIO; Casarosa, Claudio; M., Madella; A., Piccirillo
Analysis of High Barrier WN/GaAs Contacts 1-gen-1990 Bagnoli, PAOLO EMILIO; A., Paccagnella; A., Callegari; F., Fantini
Analysis of laser diode thermal properties with spatial resolution by means of the TRAIT method 1-gen-1995 Bagnoli, PAOLO EMILIO; G., Oliveti; A., Piccirillo
Analysis of laser diode thermal properties with spatial resolution by means of the TRAIT method 1-gen-1997 G., Oliveti; A., Piccirillo; Bagnoli, PAOLO EMILIO
ANALYSIS OF THE INFLUENCE OF SPATIALLY LOCALIZED OXIDE TRAPS ON THE CAPACITANCE OF MIS TUNNEL-DIODES 1-gen-1990 Nannini, Andrea; Bagnoli, PAOLO EMILIO
Applicazione del metodo TRAIT (Thermal Resistance Analysis by Induced Transient) a strutture simulate 1-gen-1994 Bagnoli, PAOLO EMILIO; Casarosa, Claudio; M., Ciampi; E., Dallago; M., Sassone
Caratterizzazione del modello termico di strutture laser a semiconduttore per mezzo di misure di tensione in regime transitorio. 1-gen-1992 Bagnoli, PAOLO EMILIO; A., Piccirillo; Ciampa, Maurizio; G., Oliveti
Characterisation of conductive heat transfer in electronic device-packages solid systems 1-gen-2001 Bagnoli, PAOLO EMILIO; DI PASCOLI, Stefano
Characterization and diagnostics of VLSI microstructures 1-gen-1989 Bagnoli, PAOLO EMILIO; Basso, Giovanni; Ciofi, Carmine; Diligenti, Alessandro; Macucci, Massimo; M., Mule'; Neri, Bruno; B., Pellegrini; Saletti, Roberto
Characterization of YSZ Films by means of C-V Measurements and TEM Observations 1-gen-1995 Bagnoli, PAOLO EMILIO; Ciofi, Carmine; Diligenti, Alessandro; A., Innamorato; Nannini, Andrea
Complete characterisation of laser diode thermal circuit by voltage transient measurements 1-gen-1993 A., Piccirillo; G., Oliveti; Ciampa, Maurizio; Bagnoli, PAOLO EMILIO
Computer-aided simulation of natural erosion processes on Rock-Art. A mathematical tool for conservation studies and absolute dating 1-gen-2014 Bagnoli, PAOLO EMILIO
Conductivity variations induced by water vapour adsorption in granular metal films 1-gen-1987 Nannini, Andrea; Bagnoli, PAOLO EMILIO; Diligenti, Alessandro; Neri, Bruno; S., Pugliese