Two types of insulated metal substrates for surface mounting technology (SMT) for automotive applications were thermally examined by means of the TRAIT method [P.E. Bagnoli, C. Casarosa, M. Ciampi, E. Dallago, Thermal resistance analysis by induced transient (TRAIT) method for power electronic devices thermal characterization. Part I: fundamentals and theory, IEEE Transactions on Power Electronics 13 (1998) 1208-1219]. The results showed a noticeably lower static thermal resistance than other solutions commonly used. Moreover, TRAIT analysis provided evidence that the residue thermal resistance has to be ascribed to the epoxy insulating layer of the IMS substrates, suggesting that the differences between different types of IMS substrates are due to differences in the dielectric deposition technology.
THERMAL PROPERTIES OF INSULATED METAL SUBSTRATE TECHNOLOGY
CASAROSA, CLAUDIO;DI PASCOLI, STEFANO;BAGNOLI, PAOLO EMILIO
1999-01-01
Abstract
Two types of insulated metal substrates for surface mounting technology (SMT) for automotive applications were thermally examined by means of the TRAIT method [P.E. Bagnoli, C. Casarosa, M. Ciampi, E. Dallago, Thermal resistance analysis by induced transient (TRAIT) method for power electronic devices thermal characterization. Part I: fundamentals and theory, IEEE Transactions on Power Electronics 13 (1998) 1208-1219]. The results showed a noticeably lower static thermal resistance than other solutions commonly used. Moreover, TRAIT analysis provided evidence that the residue thermal resistance has to be ascribed to the epoxy insulating layer of the IMS substrates, suggesting that the differences between different types of IMS substrates are due to differences in the dielectric deposition technology.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
