Noise measurements performed on almost-ideal n+-p junctions in the frequency range 0.1Hz-10kHz show that shot noise extends down to a corner frequency f* much lower than in most commercial junction diodes. Such results agree with theories that ascribe the 1/f noise to the device defect centers, and to the dispersion in their properties.

Noise in Almost Ideal n+-p Junctions

BASSO, GIOVANNI;PELLEGRINI, BRUNO
1997

Abstract

Noise measurements performed on almost-ideal n+-p junctions in the frequency range 0.1Hz-10kHz show that shot noise extends down to a corner frequency f* much lower than in most commercial junction diodes. Such results agree with theories that ascribe the 1/f noise to the device defect centers, and to the dispersion in their properties.
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11568/202837
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 0
  • ???jsp.display-item.citation.isi??? 0
social impact