PELLEGRINI, BRUNO Statistiche
PELLEGRINI, BRUNO
1/F-GAMMA NOISE IN THICK-FILM RESISTORS AS AN EFFECT OF TUNNEL AND THERMALLY ACTIVATED EMISSIONS, FROM MEASURES VERSUS FREQUENCY AND TEMPERATURE
1983-01-01 Pellegrini, Bruno; Saletti, Roberto; Terreni, Pierangelo; Prudenziati, M.
1/f^gamma from single-energy-level defects
1987-01-01 Pellegrini, Bruno
1/f^gamma noise in semiconductive devices: theory and applications
1987-01-01 Pellegrini, Bruno
A general model of 1/f^{gamma} noise
2000-01-01 Pellegrini, Bruno
A new measurement method of MOS transistor parameters
1990-01-01 Ciofi, Carmine; Macucci, Massimo; Pellegrini, Bruno
A simplified and improved model of ideal and almost ideal silicon p-n junctions: the role of oxygen
1992-01-01 Pellegrini, Bruno
A versatile cryogenic temperature controller
1998-01-01 Oppo, G; Giannetti, Romano; Macucci, Massimo; Pellegrini, Bruno
Accurate Measurement of Shot and Thermal Noise in p-n Junctions over Seven Current Decades
1991-01-01 Macucci, Massimo; Pellegrini, Bruno
Analysis of shot noise suppression in mesoscopic cavities in a magnetic field
2006-01-01 Marconcini, Paolo; Macucci, Massimo; Iannaccone, Giuseppe; Pellegrini, Bruno; Marola, Giovanni
Approaches to the tunneling time based on the Larmor clock and particle absorption as particular cases of the stay-time method
1994-01-01 Iannaccone, Giuseppe; Pellegrini, Bruno
Characteristic times in the motion of a particle
1994-01-01 Iannaccone, Giuseppe; Pellegrini, Bruno
Characterization and diagnostics of VLSI microstrucures
1990-01-01 Bagnoli, PAOLO EMILIO; Basso, Giovanni; C., Ciofi; A., Diligenti; Macucci, Massimo; M., Mul; Neri, Bruno; Pellegrini, Bruno
Coloured noise generators
1986-01-01 Pellegrini, Bruno; Saletti, Roberto; Saletti, Roberto; Saletti, Roberto
Compact formula for the density of states in a quantum well
1996-01-01 Iannaccone, Giuseppe; Pellegrini, Bruno
Concurrent effects of Pauli and Coulomb interaction in resonant tunneling diodes at low bias and low temperature
2003-01-01 Iannaccone, Giuseppe; Macucci, Massimo; Basso, Giovanni; Pellegrini, Bruno
Correlation between thermal and generation recombination noise sources: Analytical and Monte Carlo approaches
1988-01-01 Macucci, Massimo; Pellegrini, Bruno; Terreni, Pierangelo; Reggiani, L.
Coulomb breach effect emerging in shot noise
1999-01-01 Iannaccone, Giuseppe; G., Lombardi; Macucci, Massimo; Pellegrini, Bruno
Cryogenic amplification system for ultra-low noise measurements
1998-01-01 Lombardi, G; Macucci, Massimo; Giannetti, Romano; Pellegrini, Bruno
Effect of displacement current on quantum noise
1995-01-01 Pellegrini, Bruno; Macucci, Massimo; Iannaccone, Giuseppe
Effect of localization on the Fano factor of cascaded tunnel barriers
2009-01-01 Marconcini, Paolo; Macucci, Massimo; Iannaccone, Giuseppe; Pellegrini, Bruno
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| 1/F-GAMMA NOISE IN THICK-FILM RESISTORS AS AN EFFECT OF TUNNEL AND THERMALLY ACTIVATED EMISSIONS, FROM MEASURES VERSUS FREQUENCY AND TEMPERATURE | 1-gen-1983 | Pellegrini, Bruno; Saletti, Roberto; Terreni, Pierangelo; Prudenziati, M. | |
| 1/f^gamma from single-energy-level defects | 1-gen-1987 | Pellegrini, Bruno | |
| 1/f^gamma noise in semiconductive devices: theory and applications | 1-gen-1987 | Pellegrini, Bruno | |
| A general model of 1/f^{gamma} noise | 1-gen-2000 | Pellegrini, Bruno | |
| A new measurement method of MOS transistor parameters | 1-gen-1990 | Ciofi, Carmine; Macucci, Massimo; Pellegrini, Bruno | |
| A simplified and improved model of ideal and almost ideal silicon p-n junctions: the role of oxygen | 1-gen-1992 | Pellegrini, Bruno | |
| A versatile cryogenic temperature controller | 1-gen-1998 | Oppo, G; Giannetti, Romano; Macucci, Massimo; Pellegrini, Bruno | |
| Accurate Measurement of Shot and Thermal Noise in p-n Junctions over Seven Current Decades | 1-gen-1991 | Macucci, Massimo; Pellegrini, Bruno | |
| Analysis of shot noise suppression in mesoscopic cavities in a magnetic field | 1-gen-2006 | Marconcini, Paolo; Macucci, Massimo; Iannaccone, Giuseppe; Pellegrini, Bruno; Marola, Giovanni | |
| Approaches to the tunneling time based on the Larmor clock and particle absorption as particular cases of the stay-time method | 1-gen-1994 | Iannaccone, Giuseppe; Pellegrini, Bruno | |
| Characteristic times in the motion of a particle | 1-gen-1994 | Iannaccone, Giuseppe; Pellegrini, Bruno | |
| Characterization and diagnostics of VLSI microstrucures | 1-gen-1990 | Bagnoli, PAOLO EMILIO; Basso, Giovanni; C., Ciofi; A., Diligenti; Macucci, Massimo; M., Mul; Neri, Bruno; Pellegrini, Bruno | |
| Coloured noise generators | 1-gen-1986 | Pellegrini, Bruno; Saletti, Roberto; Saletti, Roberto; Saletti, Roberto | |
| Compact formula for the density of states in a quantum well | 1-gen-1996 | Iannaccone, Giuseppe; Pellegrini, Bruno | |
| Concurrent effects of Pauli and Coulomb interaction in resonant tunneling diodes at low bias and low temperature | 1-gen-2003 | Iannaccone, Giuseppe; Macucci, Massimo; Basso, Giovanni; Pellegrini, Bruno | |
| Correlation between thermal and generation recombination noise sources: Analytical and Monte Carlo approaches | 1-gen-1988 | Macucci, Massimo; Pellegrini, Bruno; Terreni, Pierangelo; Reggiani, L. | |
| Coulomb breach effect emerging in shot noise | 1-gen-1999 | Iannaccone, Giuseppe; G., Lombardi; Macucci, Massimo; Pellegrini, Bruno | |
| Cryogenic amplification system for ultra-low noise measurements | 1-gen-1998 | Lombardi, G; Macucci, Massimo; Giannetti, Romano; Pellegrini, Bruno | |
| Effect of displacement current on quantum noise | 1-gen-1995 | Pellegrini, Bruno; Macucci, Massimo; Iannaccone, Giuseppe | |
| Effect of localization on the Fano factor of cascaded tunnel barriers | 1-gen-2009 | Marconcini, Paolo; Macucci, Massimo; Iannaccone, Giuseppe; Pellegrini, Bruno |