We have performed the Monte Carlo simulation of electromigration noise in polycrystalline metal stripes, based on a two-dimensional model which takes into account both the role of grain boundaries and the effect of current density redistribution in the stripe. The noise spectrum has the characteristic 1/f^gamma (gamma is near to 2) behavior, and the total noise power strongly increases with increasing damage of the stripe. The results of the simulation exhibit a substantial qualitative agreement with experiments, giving confidence in the capability of our model of including the relevant physics involved in the failure process.
|Autori interni:||DI PASCOLI, STEFANO|
|Autori:||S. DI PASCOLI; IANNACCONE G|
|Titolo:||Simulation of electromigration noise in polycrystalline metal stripes|
|Anno del prodotto:||2000|
|Digital Object Identifier (DOI):||10.1016/S0026-2714(00)00054-8|
|Appare nelle tipologie:||1.1 Articolo in rivista|