We have performed the Monte Carlo simulation of electromigration noise in polycrystalline metal stripes, based on a two-dimensional model which takes into account both the role of grain boundaries and the effect of current density redistribution in the stripe. The noise spectrum has the characteristic 1/f^gamma (gamma is near to 2) behavior, and the total noise power strongly increases with increasing damage of the stripe. The results of the simulation exhibit a substantial qualitative agreement with experiments, giving confidence in the capability of our model of including the relevant physics involved in the failure process.

Simulation of electromigration noise in polycrystalline metal stripes

DI PASCOLI, STEFANO;IANNACCONE, GIUSEPPE
2000

Abstract

We have performed the Monte Carlo simulation of electromigration noise in polycrystalline metal stripes, based on a two-dimensional model which takes into account both the role of grain boundaries and the effect of current density redistribution in the stripe. The noise spectrum has the characteristic 1/f^gamma (gamma is near to 2) behavior, and the total noise power strongly increases with increasing damage of the stripe. The results of the simulation exhibit a substantial qualitative agreement with experiments, giving confidence in the capability of our model of including the relevant physics involved in the failure process.
DI PASCOLI, Stefano; Iannaccone, Giuseppe
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11568/205970
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