Polycrystalline lead lanthanum zirconate titanate (PLZT) thin films have been prepared by a polymeric chemical route to understand the mechanisms of phase transformations and map the microstructure and elastic properties at the nanoscale in these films. X-ray diffraction, atomic force microscopy (AFM) and ultrasonic force microscopy (UFM) have been used as investigative tools. On one side, PLZT films with mixed-phase show that the pyrochlore phase crystallizes predominantly in the bottom film-electrode interface while a pure perovskite phase crystallizes in top film surface. On the contrary, pyrochlore-free PLZT films show a non-uniform microstrain and crystallite size along the film thickness with a heterogeneous complex grainy structure leading to different elastic properties at nanoscale.
|Autori interni:||TANTUSSI, FRANCESCO|
|Autori:||E.B. Araujo;B.O. Nahime;M. Melo;F. Dinelli;F. Tantussi;P. Baschieri;F. Fuso;M. Allegrini|
|Titolo:||Processing and structural properties of random oriented lead lanthanum zirconate titanate thin films|
|Anno del prodotto:||2015|
|Digital Object Identifier (DOI):||10.1016/j.materresbull.2014.09.055|
|Appare nelle tipologie:||1.1 Articolo in rivista|