In this talk, we will present a performance assessment study of 2D materials for electronic applications, ranging from digital, analog and opto-electronics applications. Such an issue will be addressed through a multi-scale simulation approach, needed in order to get the physics playing at such dimensions. To this purpose we will exploit ab-initio calculation in order to get the main parameters to be exploited at a higher level of abstraction at the device level, by means of Non-Equilibrium Green's function formalism. We will show that, due to their ultimate thinness, 2D materials-based FETs manage to suppress short-channel effects, but intra-band tunneling can be detrimental for device performance in the sub-5 nm range.

On the perspective of 2D materials for electronic applications

FIORI, GIANLUCA;IANNACCONE, GIUSEPPE
2016-01-01

Abstract

In this talk, we will present a performance assessment study of 2D materials for electronic applications, ranging from digital, analog and opto-electronics applications. Such an issue will be addressed through a multi-scale simulation approach, needed in order to get the physics playing at such dimensions. To this purpose we will exploit ab-initio calculation in order to get the main parameters to be exploited at a higher level of abstraction at the device level, by means of Non-Equilibrium Green's function formalism. We will show that, due to their ultimate thinness, 2D materials-based FETs manage to suppress short-channel effects, but intra-band tunneling can be detrimental for device performance in the sub-5 nm range.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11568/797721
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