We present a numerical approach, based on an optimized recursive Green's function procedure, for the simulation of the imaging process performed by scanning a device with a negatively biased probe while monitoring its conductance, or, as we propose in this contribution, its shot noise. We discuss a few examples, for an adiabatic quantum dot and for mesoscopic cavities, studied over a 200 × 300 points discretization mesh. The effect of disorder associated with the random distribution of dopants is included in some of the simulations by means of a semi-analytical procedure for the evaluation of the screening from the 2DEG.
|Autori interni:||MACUCCI, MASSIMO|
|Autori:||MACUCCI M; MARCONCINI P.|
|Titolo:||High-Resolution Numerical Study of Conductance and Noise Imaging of Mesoscopic Devices|
|Anno del prodotto:||2004|
|Digital Object Identifier (DOI):||10.1007/s10825-004-7090-5|
|Appare nelle tipologie:||1.1 Articolo in rivista|