We present critical temperature measurements of titanium thin films annealed in an argon atmosphere at various temperatures. We are able to depress the TC by up to 200 mK from an initial TC of 540 mK by increasing the temperature at which the films are post-annealed from 80 to 275 ∘C. We find an anti-correlation trend between the annealing temperature and the measured TC. We also briefly discuss how we plan to use these films to produce TES detectors to be used in the LSPE/SWIPE balloon-borne cosmic microwave background polarimeter, which is slated to launch in December 2019.
Tuning the TC of Titanium Thin Films for Transition-Edge Sensors by Annealing in Argon
Cei, F.;Galli, L.;Gallucci, G.;Nicoló, D.;Piendibene, M.;Signorelli, G.;
2018-01-01
Abstract
We present critical temperature measurements of titanium thin films annealed in an argon atmosphere at various temperatures. We are able to depress the TC by up to 200 mK from an initial TC of 540 mK by increasing the temperature at which the films are post-annealed from 80 to 275 ∘C. We find an anti-correlation trend between the annealing temperature and the measured TC. We also briefly discuss how we plan to use these films to produce TES detectors to be used in the LSPE/SWIPE balloon-borne cosmic microwave background polarimeter, which is slated to launch in December 2019.File in questo prodotto:
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