Elusive features in photonic and electronic devices can be detected by means of advanced, time-domain spectroscopic techniques. In this paper we introduce a modulation spectroscopy based on the optomechanical interaction of photonic and mechanical modes. Applying the technique to a Si metasurface and its drumlike mechanical modes, we detect narrow-band quasi-bound-state-in-the-continuum (quasi-BIC) modes close to normal incidence, where their measurement can be hindered by a high-symmetry protection and undesired background modes. Showing a visibility enhancement of more than one order of magnitude, the optomechanical modulation spectroscopy can be an innovative tool for precise spectroscopy of a wide set of photonic devices, including the goal of measuring purely symmetry protected BIC resonances.

Optomechanical Modulation Spectroscopy of Bound States in the Continuum in a Dielectric Metasurface

Zanotto S.
Co-primo
;
Conte G.
Co-primo
;
Tredicucci A.;Pitanti A.
Ultimo
2022

Abstract

Elusive features in photonic and electronic devices can be detected by means of advanced, time-domain spectroscopic techniques. In this paper we introduce a modulation spectroscopy based on the optomechanical interaction of photonic and mechanical modes. Applying the technique to a Si metasurface and its drumlike mechanical modes, we detect narrow-band quasi-bound-state-in-the-continuum (quasi-BIC) modes close to normal incidence, where their measurement can be hindered by a high-symmetry protection and undesired background modes. Showing a visibility enhancement of more than one order of magnitude, the optomechanical modulation spectroscopy can be an innovative tool for precise spectroscopy of a wide set of photonic devices, including the goal of measuring purely symmetry protected BIC resonances.
Zanotto, S.; Conte, G.; Bellieres, L. C.; Griol, A.; Navarro-Urrios, D.; Tredicucci, A.; Martinez, A.; Pitanti, A.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11568/1146212
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