Sfoglia per Autore
GAS AND VAPOR EFFECTS ON THE RESISTANCE FLUCTUATION SPECTRA OF CONDUCTING POLYMER THIN-FILM RESISTORS
1994-01-01 Bruschi, Paolo; Cacialli, F; Nannini, Andrea; Neri, Bruno
Electromigration in Al based stripes: low frequency noise and MTF test
1994-01-01 Bagnoli, PAOLO EMILIO; Ciofi, Carmine; Neri, Bruno; Pennelli, Giovanni
LOW-FREQUENCY RESISTANCE FLUCTUATION MEASUREMENTS ON CONDUCTING POLYMER THIN-FILM RESISTORS
1994-01-01 Bruschi, Paolo; Cacialli, F; Nannini, Andrea; Neri, Bruno
DEPENDENCE OF ELECTROMIGRATION NOISE ON GEOMETRICAL AND STRUCTURAL CHARACTERISTICS IN ALUMINUM-BASED RESISTORS
1994-01-01 Chicca, S; Ciofi, Carmine; Diligenti, Alessandro; Nannini, Andrea; Neri, Bruno
Vapour and gas induced noise and conductivity variations in polymeric balanced bridge structures
1994-01-01 Bruschi, Paolo; Nannini, Andrea; Neri, Bruno
DIELECTRIC-BREAKDOWN AND RELIABILITY OF MOS MICROSTRUCTURES - TRADITIONAL CHARACTERIZATION AND LOW-FREQUENCY NOISE MEASUREMENTS
1995-01-01 Neri, Bruno; Olivo, P; Saletti, Roberto; Signoretta, M.
VAPOR AND GAS-SENSING BY NOISE MEASUREMENTS ON POLYMERIC BALANCED BRIDGE MICROSTRUCTURES
1995-01-01 Bruschi, Paolo; Nannini, Andrea; Neri, Bruno
Electromigration in Al based stripes: Low frequency noise measurements and MTF tests
1996-01-01 Bagnoli, PAOLO EMILIO; Ciofi, Carmine; Neri, Bruno; Pennelli, Giovanni
Ultralow-noise programmable voltage source
1997-01-01 Baracchino, L; Basso, Giovanni; Ciofi, C; Neri, Bruno
Copper metallization for integrated circuits: TEM analysis and electrical characterization
1997-01-01 Bruschi, Paolo; Ciofi, Carmine; Dattilo, V; Diligenti, Alessandro; Nannini, Andrea; Neri, Bruno
Electrical and thermal transient during dielectric breakdown of thin oxides in metal-SiO2 silicon capacitors
1998-01-01 Lombardo, S.; Crupi, F.; Neri, Bruno; Spinella, C.; Terrasi, A.; LA MANTIA, A.; LA MAGNA, A.
PC Based Low Noise Measurement System for the Chacterization of Ultra Thin Oxide MOS Devices
1998-01-01 Basso, Giovanni; Ciuti, V; Crupi, F; Giannetti, R; Neri, Bruno
A Novel Characterization Tool for the Study of Dielectric Breakdown of Ultra-Thin Oxide MOS Structures
1999-01-01 Basso, Giovanni; Crupi, F.; Giannetti, R.; Lombardo, S.; Neri, Bruno
Criteria for the evaluation of unconditional stability of microwave linear two-ports: a critical review and new proof
1999-01-01 Lombardi, G.; Neri, Bruno
Low Frequency Noise and Failure Mechanisms in Microelectronic Devices
1999-01-01 Basso, Giovanni; C., Ciofi; I., Ciofi; F., Crupi; V., Dattilo; Iannaccone, Giuseppe; S., Lombardo; Neri, Bruno
On-Off Fluctuations of the Tunnel Current Before Breakdown of the Thin Oxide MOS Devices
1999-01-01 Crupi, F.; Neri, Bruno; Lombardo, S.
Open Questions on Noise in Metal Lines Subjected to High Current Densities
1999-01-01 Ciofi, C.; Dattilo, V.; Neri, Bruno
Voltage controlled inductors for RF integrated circuits
1999-01-01 Monorchio, Agostino; G., D'Angelo; A., Granchi; Neri, Bruno
Design and Simulation of Active Spiral inductors for RF Integrated Circuits
1999-01-01 G., D'Angelo; A., Granchi; Monorchio, Agostino; Neri, Bruno
Long term noise measurements and MTF test for the characterization of Electromigration in metal lines
1999-01-01 Ciofi, C.; Dattilo, V.; Neri, Bruno
Legenda icone
- file ad accesso aperto
- file disponibili sulla rete interna
- file disponibili agli utenti autorizzati
- file disponibili solo agli amministratori
- file sotto embargo
- nessun file disponibile